发明名称 |
POSITIVE TYPE RESIST COMPOSITION FOR ELECTRON BEAMS OR X-RAYS |
摘要 |
PURPOSE: Provided is an excellent positive type resist composition for electron beams or X-rays having high sensitivity and high resolution and giving a resist pattern whose profile is rectangular. CONSTITUTION: The positive type resist composition contains a compound which generates an acid when irradiated with electron beams or X-rays, a resin having the residue of a compound having a smaller ionization potential than p-ethylphenol in a group which is released by the action of the acid and having solubility in an alkali developing solution increased by the action of the acid and at least one acetal compound having a specified structure of formula (A) and (B).
|
申请公布号 |
KR20030006957(A) |
申请公布日期 |
2003.01.23 |
申请号 |
KR20020025232 |
申请日期 |
2002.05.08 |
申请人 |
FUJI PHOTO FILM CO., LTD. |
发明人 |
MIZUTANI KAZUYOSI;SASAKI TOMOYA;SHIRAKAWA KOJI |
分类号 |
G03F7/038;G03F7/039;(IPC1-7):G03F7/039 |
主分类号 |
G03F7/038 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|