发明名称 Open-loop for waveform acquisition
摘要 Methods and apparatus, including computer program products, implementing and using techniques for open-loop waveform acquisition. In general, in one aspect, the invention provides a method for open-loop waveform acquisition. The method includes acquiring an S-curve of an acquisition loop of an electron-beam probe system. The S-curve represents a response of the acquisition loop to changes of potential differences between the acquisition loop and a device under test. The method includes calibrating the acquisition loop to obtain a linear region in the acquired S-curve and using the linear portion of the acquired S-curve to calculate voltage at a probe point of the device under test.
申请公布号 US2003016153(A1) 申请公布日期 2003.01.23
申请号 US20020136710 申请日期 2002.04.30
申请人 WANG HUI;KANAI KENICHI;KOIKE HIROYASU 发明人 WANG HUI;KANAI KENICHI;KOIKE HIROYASU
分类号 G01R31/305;(IPC1-7):H03M1/12 主分类号 G01R31/305
代理机构 代理人
主权项
地址