| 摘要 |
<p>This invention relates to sample chamber device (4), arranged to be positioned within an electron microscopy device (1), wherein a sample (3) to be analysed by said electron microscopy device (1) is arranged to be positioned within said sample chamber device (4), said sample chamber device (4) being connected with means (7) for altering the pressure within said sample chamber device in relation to the pressure of said electron microscopy device. This invention further relates to an electron microscopy device incorporating such as a sample chamber device.</p> |
