| 摘要 |
A method of detecting the leak-in of oxygen in an organic electroluminescent device via the extent of photo-degradation of the electroluminescent organic material is described. The photo-degradation of the electroluminescent organic material is induced by the presence of oxygen, and can be detected by comparing the photo luminescence of the material, before and after illumination of the material with light (e.g. form a laser). Photo-degradation due to the presence of oxygen in an encapsulated organic electroluminescent device is evidence for a leak in the device, which leak will result in a shorter lifetime of the device. The invention provides a fast, non-destructive method of inspecting organic electroluminescent devices on leakage, immediately after their production. Leak devices can be identified and discarded, even on-line.
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