发明名称 |
Multichip semiconductor device |
摘要 |
A multichip semiconductor device with an improved yield and a reduced inspection cost is provided in which a fuse is provided on a first semiconductor chip while a fuse is not provided on a second semiconductor chip as a rewritable memory, and these chips are connected inside a package. The second semiconductor chip includes redundancy cells to be replaced for defective bits. To produce a post-redundancy-restoration state in which the defective bits are replaced with the redundancy cells before the second semiconductor chip is connected with the first semiconductor chip, the second semiconductor chip includes a restoration state determining circuit and a command decode circuit. The restoration state determining circuit is for storing a redundancy restoration solution for restoring defective bits supplied via a first external input pad. The command decoder circuit controls input from the first external input pad to the restoration state determining circuit according to a signal supplied via a second external input pad. |
申请公布号 |
US2003015733(A1) |
申请公布日期 |
2003.01.23 |
申请号 |
US20020194593 |
申请日期 |
2002.07.11 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO.,LTD. |
发明人 |
HAYASHI KOHTARO;SHIRAHAMA MASANORI |
分类号 |
G06F12/16;G11C29/00;G11C29/04;H01L23/525;H01L25/065;(IPC1-7):H01L21/44;H01L23/02;H01L27/10 |
主分类号 |
G06F12/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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