发明名称 Sample preparation apparatus and method
摘要 A apparatus and method for forming windows in semiconductor devices to enable visualization of the circuitry therein while electrically intact. The device is affixed to a table that is oscillated in the X and Y directions while a succession of rotating tools are brought to bear against the surface of the device in the Z direction under a constant force. The force is adjustable so as to allow the tool to float on the surface of the workpiece.
申请公布号 US2003017649(A1) 申请公布日期 2003.01.23
申请号 US20010907354 申请日期 2001.07.17
申请人 RUBIN JOSEPH I. 发明人 RUBIN JOSEPH I.
分类号 H01L21/00;(IPC1-7):H01L21/44;H01L21/48;H01L21/50 主分类号 H01L21/00
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