Test pattern generation circuit and method for use with self-diagnostic circuit

摘要

A test pattern generation circuit for use with a self-diagnostic circuit which produces a test pattern through use of a microinstruction code, which includes a memory device RAM/ROM which temporarily stores the microinstruction code and outputs two different instruction codes within one clock cycle; a selector SEL which receives output from the memory device and selectively delays the two instruction codes, thereby outputting one code; and a pattern generation circuit PG which produces a test pattern corresponding to output from the selector.