| 摘要 |
The present invention relates to a method for obtaining electronic circuits wherein the design steps (100) constituted by a first development and testin g cycle (200), of the functional type, and a second development and testing cycle (300), of the architectural type, are managed using, as inputs, for bo th cycles (200 and 300) the same configuration files (140) and stimuli (150) an d generating, at the output, results having equivalent (230, 330) and comparab le (333) formats. Thanks to these characteristics, it is possible to conduct in integrated fashion functional tests (220) and architectural tests (320) on corresponding functional and architectural models of electronic circuits and verify the perfect correspondence between the different types of models as t he configurations files (140) and stimuli (150) vary.
|
