发明名称 Defect inspection method
摘要 An image picked up by a detection system capable of actualizing a three-dimensional inclination is usually poor in the signal-to-noise ratio, and it is difficult to stably detect minute defects. Images that actualize a three-dimensional inclination are picked up from opposed directions. The images are subject to subtraction and addition. The images improved in signal-to-noise ratio as compared with original images are calculated. The images calculated and improved in signal-to-noise ratio respectively of a defect portion and a reference portion are compared with each other. Regions differing in comparison results are detected as defects. As a result, minute defects can be inspected stably.
申请公布号 US2003015659(A1) 申请公布日期 2003.01.23
申请号 US20020081782 申请日期 2002.02.20
申请人 HITACHI, LTD. 发明人 HONDA TOSHIFUMI;OKUDA HIROHITO;OZAWA YASUHIKO;KITAHASHI KATSUHIRO
分类号 G01B11/30;G01B11/24;G01B11/245;G01B15/00;G01B15/04;G01N21/956;G01N23/225;H04N7/18;H04N13/00;(IPC1-7):G21K7/00;G01N23/00 主分类号 G01B11/30
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