发明名称 Surface texture measuring apparatus
摘要 A surface texture measuring apparatus allowing effects of vibration disturbance to be removed and a highly accurate measurement to be achieved. The surface texture measuring apparatus is further provided with a small surface texture measuring apparatus, which detects the amount of vibration of a workpiece while maintaining a detecting device in contact with the surface of the workpiece without moving the device along the workpiece. The main surface texture measuring apparatus conducts measurement with a high accuracy based on the detected unevenness value of the surface of the workpiece and on the amount of vibration detected by the small surface texture measuring apparatus.
申请公布号 US6510363(B1) 申请公布日期 2003.01.21
申请号 US20000549613 申请日期 2000.04.14
申请人 MITUTOYO CORPORATION 发明人 HIDAKA HIROYUKI;KANEMATSU TOSHIHIRO;HONDA HIROOMI;MISHIMA HIDEKI;ISHITOYA TAKAO
分类号 G01B21/20;G01B21/30;(IPC1-7):G06F19/00;G01B5/28;G01B11/24;G01F17/00;G01F23/00;G01F19/00 主分类号 G01B21/20
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