发明名称 High dielectric constant materials as gate dielectrics (insulators)
摘要 A method and structure for a metal oxide semiconductor field effect transistor (MOSFET) includes patterning a gate stack (having a gate conductor layer and a gate dielectric) over a substrate and modifying the gate dielectric beneath the gate conductor, such that the gate dielectric has a central portion and modified dielectric regions adjacent the central portion. The modified dielectric regions have a lower dielectric constant than that of the gate dielectric and the central portion is shorter than the gate conductor.
申请公布号 US6509612(B2) 申请公布日期 2003.01.21
申请号 US20010848431 申请日期 2001.05.04
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CLEVENGER LAWRENCE A.;HSU LOUIS L.;RADENS CARL J.;SHEPARD, JR. JOSEPH F.
分类号 H01L21/265;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/49;H01L29/51;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L21/265
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