发明名称 |
High dielectric constant materials as gate dielectrics (insulators) |
摘要 |
A method and structure for a metal oxide semiconductor field effect transistor (MOSFET) includes patterning a gate stack (having a gate conductor layer and a gate dielectric) over a substrate and modifying the gate dielectric beneath the gate conductor, such that the gate dielectric has a central portion and modified dielectric regions adjacent the central portion. The modified dielectric regions have a lower dielectric constant than that of the gate dielectric and the central portion is shorter than the gate conductor.
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申请公布号 |
US6509612(B2) |
申请公布日期 |
2003.01.21 |
申请号 |
US20010848431 |
申请日期 |
2001.05.04 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
CLEVENGER LAWRENCE A.;HSU LOUIS L.;RADENS CARL J.;SHEPARD, JR. JOSEPH F. |
分类号 |
H01L21/265;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/49;H01L29/51;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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