发明名称 |
Processing semiconductor devices having some defective input-output pins |
摘要 |
Techniques to process semiconductor devices whose input-output (I/O) pins are only partially operative is able to accommodate substantially all possible combinations of operative I/O pin patterns. Semiconductor devices are tested to determine which I/O pins are operative. A code representing which I/O pins are operative is then associated with each tested device. The generated codes are used to selectively combine two or more semiconductor devices to form a component capable of providing the function of a single fully operational semiconductor device.
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申请公布号 |
US6510443(B1) |
申请公布日期 |
2003.01.21 |
申请号 |
US19980207090 |
申请日期 |
1998.12.07 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
CHARLTON DAVID;PRAK SOVANDY |
分类号 |
G11C29/00;G11C29/02;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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