发明名称 Insulated gate semiconductor device with high minority carrier injection and low on-voltage by enlarged pn-junction area
摘要 A semiconductor device is formed such that a contact surface between a p-type high-concentration semiconductor region and an n-type high-concentration buffer region assumes a convexo-concave shape. This makes it possible to enlarge an area of the contact surface between the p-type high-concentration semiconductor region and the n-type high-concentration buffer region. As a result, holes are injected into an n-type low-concentration drift region from the p-type high-concentration semiconductor region with higher efficiency and with a less voltage drop between the pn-junction. Thus, effects of conductivity modulation can be achieved sufficiently and the on-resistance and the voltage drop of an IGBT can be lowered.
申请公布号 US6509610(B2) 申请公布日期 2003.01.21
申请号 US20010906825 申请日期 2001.07.18
申请人 TOYOTA JIDOSHA KABUSHIKI KAISHA 发明人 KAWAHASHI AKIRA;NISHIWAKI KATSUHIKO
分类号 H01L29/744;H01L29/08;H01L29/739;H01L29/78;(IPC1-7):H01L21/336;H01L29/078 主分类号 H01L29/744
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