发明名称 |
Semiconductor device and method for fabricating the same |
摘要 |
A semiconductor device and method of fabricating the same. The semiconductor device includes a first insulating film formed on a substrate and having a plurality of holes therein; a cavity formed under the first insulating film; an impurity region formed in the substrate and around the cavity; a second insulating film formed on portions of the first insulating film to fill the holes and a space between the cavity and the impurity region; a plurality of contact holes formed to expose certain portions of the impurity region; and a plurality of wiring layers formed to be in contact with the impurity region through the contact holes.
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申请公布号 |
US6509210(B2) |
申请公布日期 |
2003.01.21 |
申请号 |
US20000736205 |
申请日期 |
2000.12.15 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
PARK YOUNG JUNE;LEE JONG HO;LEE HYEOK JAE |
分类号 |
H01L21/02;H01L21/336;H01L21/764;(IPC1-7):H01L21/00 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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