发明名称 Two transistor ferroelectric non-volatile memory
摘要 A two transistor ferroelectric non-volatile memory cell includes a ferroelectric capacitor connected to a word line and having an upper electrode and a lower electrode; a first MOS transistor having a linear capacitor located at a gate oxide region thereof, wherein a gate of the first MOS transistor is connected to the lower electrode of said ferroelectric capacitor and wherein a drain of the first transistor is connected to a bit line; a second MOS transistor having a gate connected to a programming line, a drain connected to the lower electrode of the ferroelectric capacitor, and a source connected to a ground and the source of the first transistor; wherein, when a positive pulse is applied to the word line and to the programming line, a charge is placed on the ferroelectric capacitor and the ferroelectric capacitor is decoupled from the MOS linear capacitor by connecting the bottom electrode of the ferroelectric capacitor to the ground state. When a positive pulse is applied to the word line and a positive pulse is applied to the programming line, a "1" state is created. When a negative pulse is applied to the word line and a positive pulse is applied to the programming line, a "0" state is created.
申请公布号 US6510073(B1) 申请公布日期 2003.01.21
申请号 US20020062850 申请日期 2002.01.31
申请人 SHARP LABORATORIES OF AMERICA, INC. 发明人 LEE JONG-JAN;HSU SHENG TENG
分类号 G11C11/22;H01L21/8246;H01L27/105;(IPC1-7):G11C11/22 主分类号 G11C11/22
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