发明名称 KEY TOP, MANUFACTURING DEVICE FOR IT, AND ARRANGEMENT INSPECTION DEVICE KEY TOP
摘要 PROBLEM TO BE SOLVED: To provide a key top capable of being quickly and correctly inspected whether it is arranged at a predetermined position on an input device, to provide a manufacturing device for the key top, and to provide an arrangement inspection device for inspecting arranged state in the input device having the key top. SOLUTION: This key top 11 has arrangement information, indicating a mounting position on the input device 14 for arranging the plural key tops 11, by matching it with a character 13 indicated on each surface thereof. This manufacturing device for the key top 11 is provided with a recording means 41 for recording the arrangement information, indicating the mounting position on the input device of the key top 11 in a predetermined area 12 on the surface of the key top 11. This arrangement inspection device of the key top is provided with a read means 21 for reading the arrangement information of the respective key tops 11 mounted on the input device, and a determination means 22 for determining whether or not the read arrangement information agrees with arrangement information in previously specified design data.
申请公布号 JP2003016861(A) 申请公布日期 2003.01.17
申请号 JP20010201270 申请日期 2001.07.02
申请人 NAGANO FUJITSU COMPONENT KK 发明人 SHIMADA YOSHIHIRO
分类号 H01H13/02;H01H9/00;H01H9/16;H01H13/70;(IPC1-7):H01H9/16 主分类号 H01H13/02
代理机构 代理人
主权项
地址