| 摘要 |
PROBLEM TO BE SOLVED: To realize a memory card test device capable of simultaneously inspecting a plurality of memory cards, easy in operation and capable of inspecting a number of the memory cards in a short time. SOLUTION: The memory card test device is provided with a plurality of connectors 21-0 to 21-N mounting the memory cards, a gate circuit comprising FPGA1 realizing a function generating a prescribed test signal to be commonly transmitted to the plurality of the memory cards and judging to individually take in response signals from each of the memory cards, and LEDs 22-0 to 22-N displaying quality of a judging result on each of the memory cards. |
