发明名称 METHOD OF MANUFACTURING III NITRIDE COMPOUND SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To form an element layer having proper crystallinity by preventing the warping of a substrate in a manufacturing process, in a method of manufacturing a III nitride compound semiconductor element. SOLUTION: Base layers are formed simultaneously on both surfaces of an auxiliary substrate, which is formed of a material different from that of a III nitride compound semiconductor, and then the element layer formed of a III nitride compound semiconductor is formed on the base layer on one side.
申请公布号 JP2003017412(A) 申请公布日期 2003.01.17
申请号 JP20010196799 申请日期 2001.06.28
申请人 TOYODA GOSEI CO LTD 发明人 TAKI TETSUYA;KAMIMURA TOSHIYA
分类号 H01L29/201;H01L21/205;H01L33/32 主分类号 H01L29/201
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