| 摘要 |
PROBLEM TO BE SOLVED: To provide an image pickup device that corrects nonlinearity of gradation due to leakage of infrared rays and can obtain visible information and foreign matter flaw information without drop in illumination. SOLUTION: The image pickup device is provided with an image processing section 5 that picks up visible information and foreign matter flaw information from a film and corrects a foreign matter flaw on the visible information on the basis of the foreign matter flaw information and is further provided with an optical correction means 60 that corrects a leaked component resulting from the light for picking up the foreign matter flaw information leaked to the light for the visible information so as to correct the gradation of the visible information. The device is also provided with a light source restriction means 70 for restricting incidence of the light from a visible information light source onto an image pickup device for picking up the foreign matter flaw information and for restricting incidence of the light from the light source for foreign matter flaw information onto the visible information image pickup device.
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