发明名称 CELL PACK
摘要 PROBLEM TO BE SOLVED: To provide a cell pack enabled to analyze the cause of defect by recording a data related to the storage deterioration and charging and discharging deterioration of a secondary cell. SOLUTION: A microcomputer 2 calculates residual capacity of secondary cells 1a-1d from the detected value detected by a current detection means 4, and records the data of cell temperature and residual capacity which are related to the storage deterioration of the secondary cells 1a-1d, and also records the data of total charging capacity, total discharging capacity, residual capacity at the start of discharge, cell voltage at full charge, the number of times of detected over charges and the like, which are related to the charging and discharging deterioration, to a memory 6. When a defect is generated at the cell pack, the cause of deterioration of the secondary cells 1a-1d is specified by analyzing the data recorded in the memory 6, and utilized for the improvement and design of the battery pack.
申请公布号 JP2003017138(A) 申请公布日期 2003.01.17
申请号 JP20010202944 申请日期 2001.07.04
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SEGAWA SUSUMU
分类号 H01M10/48;H01M2/10;(IPC1-7):H01M10/48 主分类号 H01M10/48
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