| 摘要 |
<p>PROBLEM TO BE SOLVED: To effectively adjust a resistance value of a resistance material film of a resistor. SOLUTION: This resistance value adjusting method is capable of adjusting a resistance value of a film resistor in which a plurality of linear conductor films 1 are formed in parallel on a substrate, a resistance film 2 is formed over the width direction of the linear conductor film 1 which is a part of a plurality of linear conductor films 1, and a resistance value to be detected changes when an electrical contact is slid for over a plurality of linear conductor film 1. The trimming is performed for the width direction of the linear conductor films 1 when the resistance value is adjusted using, as single resistance material film, a resistance material film 2 formed to a first linear conductor film 1A formed to a management point where a first resistance value is detected when the electrical contact is slid and a second linear conductor film 1B formed, via this first linear conductor film 1A and a plurality of linear conductor films 1, to a management point where a second resistance value is detected when the electrical contact is slid.</p> |
