发明名称 Environment exchange control for material on a wafer surface
摘要 Systems and methods are described for environmental exchange control for a polymer on a wafer surface. An apparatus for controlling an exchange between an environment and a polymer on a surface of a wafer located in the environment includes: a chamber adapted to hold the wafer, define the environment, and maintain the polymer in an adjacent relationship with the environment; and a heater coupled to the chamber. A method for improving performance of a spin-on material includes: forming the spin-on material on a surface of a wafer; then locating the spin-on material in an environment so that said environment is adjacent said spin-on material; and then controlling an exchange between the spin-on material and said environment. The systems and methods provide advantages because inappropriate deprotection is mitigated by careful control of the environmental temperature and environmental species partial pressures (e.g. relative humidity).
申请公布号 US2003010289(A1) 申请公布日期 2003.01.16
申请号 US20020161840 申请日期 2002.06.03
申请人 GURER EMIR;LEE ED C.;ZHONG TOM;GOLDEN KEVIN;LEWELLEN JOHN W.;WACKERMAN SCOTT C.;REYNOLDS REESE 发明人 GURER EMIR;LEE ED C.;ZHONG TOM;GOLDEN KEVIN;LEWELLEN JOHN W.;WACKERMAN SCOTT C.;REYNOLDS REESE
分类号 G03F7/039;G03F7/16;G03F7/20;G03F7/26;G03F7/38;H01L21/027;(IPC1-7):C23C16/00 主分类号 G03F7/039
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