发明名称 |
CHEMICAL MECHANICAL POLISHING SLURRY FOR SEMICONDUCTOR INTEGRATED CIRCUIT,POLISHING METHOD AND SEMICONDUCTOR INTEGRATED CIRCUIT |
摘要 |
A chemical mechanical polishing slurry which comprises (a) water, (b) polishing grains in an amount of 0.01 to 30 mass % and (c) an anthranilic acid copper chelate and/or a quinaldinic acid copper chlate in an amount of 0.05 to 10 mass % in terms of anthranilic acid and/or a quinaldinic acid; and a method for polishing a semiconductor integrated circuit having copper wiring which comprises using the chemical mechanical polishing slurry. The polishing slurry allows the solution of the dishing problem associated with the flatting processing by the chemical mechanical polishing method for a semiconductor integrated circuit, in a field of a circuit having copper wiring for which the commercial need is increasing.
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申请公布号 |
WO03005431(A1) |
申请公布日期 |
2003.01.16 |
申请号 |
WO2002JP06590 |
申请日期 |
2002.06.28 |
申请人 |
SEIMI CHEMICAL CO., LTD.;TSUGITA, KATSUYUKI;SHINMARU, SACHIE |
发明人 |
TSUGITA, KATSUYUKI;SHINMARU, SACHIE |
分类号 |
B24B37/04;C09G1/02;C09K3/14;H01L21/321;(IPC1-7):H01L21/304;B24B37/00 |
主分类号 |
B24B37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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