发明名称 |
Particle analysis as a detection system for particle-enhanced assays |
摘要 |
This invention provides an improved particle-enhanced assay for determining the concentration of any of a wide range of analytes with a high degree of specificity, accuracy, and sensitivity, primarily by improving the measurement of particle aggregates. Analyte concentration is determined by effecting a particle-enhanced reaction in an assay medium and measuring the distribution of different sized aggregated particles in the reaction mixture by polarization intensity differential scattering. The particle size distribution is then compared with a standard curve to determine the concentration of the analyte in the sample.
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申请公布号 |
US2003013083(A1) |
申请公布日期 |
2003.01.16 |
申请号 |
US20010906511 |
申请日期 |
2001.07.16 |
申请人 |
TSAI TENLIN S.;XU RENLIANG |
发明人 |
TSAI TENLIN S.;XU RENLIANG |
分类号 |
G01N33/53;C12Q1/04;C12Q1/68;G01N15/00;G01N15/02;G01N15/06;G01N33/543;G01N33/545;G01N33/577;(IPC1-7):C12Q1/70 |
主分类号 |
G01N33/53 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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