发明名称 Reliability barrier integration for Cu application
摘要 The present invention provides a process sequence and related hardware for filling a hole with copper. The sequence comprises first forming a reliable barrier layer in the hole to prevent diffusion of the copper into the dielectric layer through which the hole is formed. One sequence comprises forming a generally conformal barrier layer over a patterned dielectric, etching the bottom of the hole, depositing a second barrier, and then filling the hole with copper. An alternative sequence comprises depositing a first barrier layer over a blanket dielectric layer, forming a hole through both the barrier layer and the dielectric layer, depositing a generally conformal second barrier layer in the hole, removing the barrier layer from the bottom of the hole, and selectively filling the hole with copper.
申请公布号 US2003013297(A1) 申请公布日期 2003.01.16
申请号 US20020245104 申请日期 2002.09.16
申请人 APPLIED MATERIALS, INC. 发明人 CHEN FUSEN;CHEN LIANG-YUH;MOSELY RODERICK CRAIG;EIZENBERG MOSHE
分类号 H01L21/285;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/285
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