| 摘要 |
The present invention provides an apparatus for testing a device (102) for storing data, which has a device for comparing actual data with set point data for individual storage areas and a device for supplying a comparison signal (106) for each storage area, which comparison signal (106) has a first state if the actual data is identical to the set point data, and a second state if the actual data is not identical to the set point data. The testing apparatus has a circuit board (100) on which the storage device (102) can be mounted, and a device (108) for comparing the states of the comparison signals at the pins of the storage device (102) which are assigned to the comparison signals (106), and for supplying a status signal (110) which, as a function of the state of the comparison signal, has a first state if the storage device (102) is operationally capable, and has a second state if the storage device (102) is defective.
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