| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that it was hitherto necessary that a designer of a test pattern considers a connection of a NAND gate inside an LSI in each LSI to create the test pattern from a logic circuit for preparation, as the number of steps of the NAND gate, an arrangement order of the NAND gate in the LSI and a placement of a connection terminal are different according to a type of LSI. SOLUTION: In a test pattern generator, a NAND tree test generation part determines the number of test pattern based on information on the number of gates stored in a tree information storage part, and generates a first test pattern which defines a specified value to be provided to a plurality of terminals of a test circuit by the determined number of test patterns in accordance with an arrangement order of a NAND gate indicated by storage order of identification information stored in the tree information storage part. It is unnecessary that a designer of the test pattern considers a connection of the NAND gate inside on LSI to create the test pattern from a logic circuit. |
