发明名称 APPARATUS FOR HEATING VIEW PORT OF SEMICONDUCTOR FABRICATION EQUIPMENT
摘要 PURPOSE: An apparatus for heating a view port of semiconductor fabrication equipment is provided to prevent a polymer generated from non-reacted gases in an etching process by using a heating portion for heating the view port. CONSTITUTION: An etch chamber(10) is used for forming plasma in an etching process. A view port quartz(12) transmits wavelength of the plasma generated from the etch chamber(10). An EPD(End Point Detection) cable(14) is connected with the view port quartz(12) in order to transmit the wavelength of the plasma. A heating portion(18) is installed at the view port quartz(12) in order to prevent a polymer adhered on the view port quartz(12) by heating the view port quartz(12). AN EPD controller(16) is used for reading the wavelength of the plasma transmitted from the EPD cable(14) and calculating correctly an etching time.
申请公布号 KR20030004464(A) 申请公布日期 2003.01.15
申请号 KR20010039948 申请日期 2001.07.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, HEUNG SANG
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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