发明名称 FIELD EFFECT TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME, AND INTEGRATED CIRCUIT ELEMENT
摘要 PURPOSE: To provide a field effect transistor where a distortion Si layer or a distortion SiGe layer is formed on the grid relax SiGe layer and a method for manufacturing this field effect transistor and an integrated circuit device capable of reducing the feedthrough displacement density of the grid relax SiGe layer. CONSTITUTION: This field effect transistor is provided with a substrate 6, an insulating layer 5 formed on the substrate 6, a lattice relaxation SiGe layer 4 formed like an island on the insulating layer 5, a distortion Si layer 3 formed on the lattice relaxation SiGe layer 4, a gate insulating layer 2 formed on the distortion Si layer 3, and a gate electrode 1 formed on the gate insulating layer 2. In this case, a distortion Si layer 3' is positioned on the face within 5 μm from the periphery of the contact face of the lattice relaxation SiGe layer 4 to the insulating layer 5, and the gate insulating layer 2 is formed on this.
申请公布号 KR20030005044(A) 申请公布日期 2003.01.15
申请号 KR20020038851 申请日期 2002.07.05
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KAWAKUBO TAKASHI;SUGIYAMA NAOHARU;TEZUKA TSUTOMU
分类号 H01L27/08;H01L21/20;H01L21/336;H01L21/337;H01L21/8234;H01L27/088;H01L29/10;H01L29/78;H01L29/786;H01L29/80;(IPC1-7):H01L29/78 主分类号 H01L27/08
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