| 摘要 |
PROBLEM TO BE SOLVED: To improve accuracy of controlled film thickness in electrodeposition coating. SOLUTION: This method for predicting the film thickness comprises employing a device 10 for predicting the film thickness, electrodeposition coating a material 20 to be coated for test, measuring variations with time of current density in constant voltage with a current density measurement device 20 while monitoring voltage with a voltmeter 24, and determining variations with time of current densities in several applied voltages, while measuring duration of voltage-applied time, and then determining a relationship between [value of voltage integrated by time] and [current density/applied voltage], further employing the coulomb-amount measurement device 28 in place of the current-density measurement device 20 of the device 10, measuring an amount of the coating by a coating-amount measurement device 32, and determining the relation between [coulomb amount per unit area] and [coating amount], and then, determining the relation between [current density/applied voltage]×[value of voltage integrated by time] and [coating amount], on the basis of a correlation between [current density/applied voltage]×[value of voltage integrated by time] and [coulomb amount per unit area], and determining the relation of the variations with time of the applied voltage and the coating amount, according to the above relation.
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