发明名称 POINT DIFFRACTION INTERFEROMETER AND ALIGNER
摘要 PROBLEM TO BE SOLVED: To provide a compact interferometer capable of forming a strict common optical path even in measurements of both a transmitted wave front and a surface shape. SOLUTION: In this point diffraction interferometer, a luminous flux from a light source is divided into two or more luminous fluxes by a luminous flux dividing means, and converged to different positions by a condenser lens, and only two luminous fluxes of the divided luminous fluxes are transmitted by a pinhole plate provided with two pinholes and arranged on the focal plane of the condenser lens, and then interfered to each other. This interferometer is characterized in that the luminous fluxes are transmitted or reflected by a lens of a subject and then transmitted again by the pinhole plate from the reverse direction.
申请公布号 JP2003014415(A) 申请公布日期 2003.01.15
申请号 JP20010198743 申请日期 2001.06.29
申请人 CANON INC 发明人 KONOUCHI OSAMU;AOKI EIJI
分类号 G01B9/02;G01B11/24;H01L21/027;(IPC1-7):G01B9/02 主分类号 G01B9/02
代理机构 代理人
主权项
地址