发明名称 Substrate including wide low-defect region for use in semiconductor element
摘要 <p>In a process for producing a substrate for use in a semiconductor element: a porous anodic alumina film having a great number of minute pores is formed on a surface of a base substrate; the surface of the base substrate is etched by using the porous anodic alumina film as a mask so as to form a great number of pits on the surface of the base substrate; the porous anodic alumina film is removed; and a GaN layer is formed on the surface of the base substrate by crystal growth.</p>
申请公布号 EP1276140(A2) 申请公布日期 2003.01.15
申请号 EP20020014735 申请日期 2002.07.03
申请人 FUJIFILM CORPORATION 发明人 FUKUNAGA, TOSHIAKI;KUNIYASU, TOSHIAKI;WADA, MITSUGU;HOTTA, YOSHINORI
分类号 C30B25/02;C30B25/18;H01L21/20;(IPC1-7):H01L21/20 主分类号 C30B25/02
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