| 摘要 |
<p>PROBLEM TO BE SOLVED: To improve a test efficiency per socket in an aging test of memory parts and enable the aging test for a different type of memory parts as well. SOLUTION: An aging testing board 4 is one for carrying out an aging test for a plurality of memory parts 3 by inserting into a first socket 2 of an aging testing mother board 1, and comprises a plurality of second sockets 5 into which memory parts are inserted; an edge connector 9 which can be inserted into the first socket of the mother board; and a signal line 10 for connecting the edge connector with the plurality of second sockets.</p> |
