发明名称 CREATION METHOD FOR REFERENCE DATA AND CIRCUIT-BOARD INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a creation method in which reference data about a conductor pattern is created in a short time and with satisfactory efficiency. SOLUTION: In the creation method in which the reference data used to inspect the conductor pattern is created, a selection process (Step 21) in which the conductor pattern is selected, a measuring process (Step 22) in which the interelectrode capacitance of the selected conductor pattern is measured, and a disconnection or short-circuit inspection process (Steps 23, 25) in which its disconnection or short circuit is detected, are executed repeatedly with reference to each conductor pattern until and interelectrode capacitance regarding a normal conductor pattern is measured. A calculation process (Step 28) in which an interelectrode capacitance per unit area regarding the conductor pattern is calculated on the basis of the interelectrode capacitance regarding the measured normal conductor pattern and on the basis of area information on each conductor pattern is executed, and the area of each conductor pattern is multiplied by the interelectrode capacitance per unit area so as to be found. On the basis of a first reference capacitance, the reference data regarding each conductor pattern is created.
申请公布号 JP2003014808(A) 申请公布日期 2003.01.15
申请号 JP20010195950 申请日期 2001.06.28
申请人 HIOKI EE CORP 发明人 TANAKA YUJI;MINAMI HIDEAKI
分类号 G01R31/02;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
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