发明名称 MICROSCOPE EQUIPPED WITH PROTECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a microscope equipped with a protection system to prevent a laser beam, etc., from entering the eyes of an observer. SOLUTION: The microscope includes a light cutoff/non-cutoff change-over member 25 which is provided in an optical system for macro-scopic observation and can take a light cutoff state and a light non-cutoff state of macro-scopic observation, light cutoff/non-cutoff state detecting member 27 which detects the cutoff state or non-cutoff state of the light cutoff/non-cutoff change-over member 25 to send out a corresponding cutoff state signal or non-cutoff state signal, and a laser beam cutoff/non-cutoff change-over member 31 which is provided in a laser beam illumination optical system 7 and can take a laser beam cutoff state or a laser beam non-cutoff state. The microscope is further provided with a control member 35 which supplies the cutoff signal or non-cutoff signal of a laser beam to the laser beam cutoff/non-cutoff change-over member 31 according to the cutoff state signal or non-cutoff state signal from the light cutoff/non-cutoff state detecting member 27.
申请公布号 JP2003015044(A) 申请公布日期 2003.01.15
申请号 JP20010203363 申请日期 2001.07.04
申请人 NIKON CORP 发明人 TOKURA TAKAYUKI
分类号 G02B21/00;G02B21/24;(IPC1-7):G02B21/00 主分类号 G02B21/00
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