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发明名称
Prober and probe method
摘要
申请公布号
EP0877258(B1)
申请公布日期
2003.01.15
申请号
EP19980108159
申请日期
1998.05.05
申请人
TOKYO ELECTRON LIMITED
发明人
IINO, SHINJI;YOSHIOKA, HARUHIKO
分类号
G01R31/28;(IPC1-7):G01R1/073;G01R31/316
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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