| 摘要 |
PURPOSE: A test site of a device test handler is provided to reduce the index time of a device by using a cam method to drive the connection unit of a test site. CONSTITUTION: A test site of a device test handler includes a stopper for stopping the device falling down and divided by a sleeve to a predetermined position of a test site, a stopper operation member(303) for operating the stopper, a plurality of test pins(303) installed to electrically connect one side of the test site to the test equipment at outside for connecting and disconnecting the lead of the device, a pin operation member(306) for operating the test pins by connecting with the test pins, a first cam(311) connected to one side of the stopper operation member(303) and a second cam(312) connected to one adjacent side of the pin operation member(303), wherein the stopper operation member(303) and the pin operation member(306) are continuously moved by the rotation movements of the first and the second cams(311,312) and the device test handler operates the stopper and the test pin. |
