发明名称 MOS transistor and fabrication method thereof
摘要 A CMOS transistor is provided having a relatively high breakdown voltage. The CMOS transistor includes an N-type epitaxial layer on a P-type substrate. Between the substrate and epitaxial layer are a heavily doped N-type buried layer and a heavily doped P-type base layer. An N-type sink region is proximatethe edge of the NMOS region, and twin wells are in the area surrounded with the sink region. N+ source and drain regions are formed in respective wells. As the sink region is interposed between the drain and isolation regions, a breakdown occurs between the sink and isolation regions when a high voltage is applied. Twin wells are also formed in the PMOS region P+ source and drain regions are formed in respective wells. As the N-type well surrounds the source and bulk regions, a breakdown occurs between a buried region and the isolation region when a high voltage is applied.
申请公布号 US6507080(B2) 申请公布日期 2003.01.14
申请号 US20010761902 申请日期 2001.01.17
申请人 FAIRCHILD KOREA SEMICONDUCTOR LTD. 发明人 JANG KYUNG-OUN;LEE SUN-HAK
分类号 H01L21/8238;H01L27/092;H01L29/08;H01L29/10;H01L29/423;H01L29/78;(IPC1-7):H01L29/72 主分类号 H01L21/8238
代理机构 代理人
主权项
地址