发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To increase the junction breakdown voltage of a DRAM which has a hierarchical word line structure. SOLUTION: In a DRAM which has a hierarchical word line structure consisting of main-word lines and sub-word lines, among various word line driving transistors, NMOS transistors 14 for which a higher voltage than a power supply voltage VDD is applied are arranged in a well region 1A for forming memory cells.
申请公布号 JP2003007851(A) 申请公布日期 2003.01.10
申请号 JP20010184339 申请日期 2001.06.19
申请人 SANYO ELECTRIC CO LTD 发明人 MOGI HIROSHI;GOTO YUJI
分类号 G11C11/407;G11C11/401;H01L21/8242;H01L27/108 主分类号 G11C11/407
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