发明名称 |
SEMICONDUCTOR SUBSTRATE, FIELD EFFECT TRANSISTOR AND THEIR MANUFACTURING METHODS |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor substrate and a field effect transistor respectively having SiGe layers which are low in interlayer transition density and surface roughness. SOLUTION: The semiconductor substrate has an Si substrate 1, the SiGe layer SG formed on the surface of the substrate 1, and an implanted region 1a, into which hydrogen ions or helium ions are implanted near the surface of the substrate 1.
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申请公布号 |
JP2003007615(A) |
申请公布日期 |
2003.01.10 |
申请号 |
JP20010186767 |
申请日期 |
2001.06.20 |
申请人 |
MITSUBISHI MATERIALS SILICON CORP;MITSUBISHI MATERIALS CORP |
发明人 |
MIZUSHIMA KAZUKI |
分类号 |
H01L29/78;H01L21/20;H01L21/205;H01L21/265;(IPC1-7):H01L21/20 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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