发明名称 |
METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a capacitor of a semiconductor device is provided to avoid the height of the capacitor and simplify a process by using RuO2 as a hard mask instead of an etch process using a poly hard mask. CONSTITUTION: A capacitor oxide(22) is deposited on a substrate. The hard mask made of RuO2 and an anti-reflective coating(ARC) are deposited on the capacitor oxide. A photoresist mask is deposited and patterned on the ARC. The ARC and the RuO2 hard mask are etched by using the patterned photoresist mask through an in-situ process. The capacitor oxide is etched and patterned. The RuO2 hard mask is eliminated.
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申请公布号 |
KR20030003351(A) |
申请公布日期 |
2003.01.10 |
申请号 |
KR20010038674 |
申请日期 |
2001.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
BAE, YEONG HEON;KIM, JONG SAM;LEE, HONG GU;SHIN, HUI SEUNG |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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