发明名称 METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a capacitor of a semiconductor device is provided to avoid the height of the capacitor and simplify a process by using RuO2 as a hard mask instead of an etch process using a poly hard mask. CONSTITUTION: A capacitor oxide(22) is deposited on a substrate. The hard mask made of RuO2 and an anti-reflective coating(ARC) are deposited on the capacitor oxide. A photoresist mask is deposited and patterned on the ARC. The ARC and the RuO2 hard mask are etched by using the patterned photoresist mask through an in-situ process. The capacitor oxide is etched and patterned. The RuO2 hard mask is eliminated.
申请公布号 KR20030003351(A) 申请公布日期 2003.01.10
申请号 KR20010038674 申请日期 2001.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 BAE, YEONG HEON;KIM, JONG SAM;LEE, HONG GU;SHIN, HUI SEUNG
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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