发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PURPOSE: To reduce a cell area in a flash memory device of a single gate structure. CONSTITUTION: In an active area forming a floating gate electrode on an Si substrate forming a burying dispersion area being a control gate so as to be capacity-coupled through an insulating of the surface of the Si substrate and forming a flash memory cell, an n type dispersion area being a source area and a drain area is formed on both sides of the floating gate electrode.
申请公布号 KR20030003675(A) 申请公布日期 2003.01.10
申请号 KR20020020371 申请日期 2002.04.15
申请人 FUJITSU LIMITED 发明人 HASHIMOTO HIROSHI;TAKAHASHI KOJI
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/115;H01L21/824 主分类号 H01L21/8247
代理机构 代理人
主权项
地址