发明名称 CMP APPARATUS HAVING ADIABATIC MATERIAL
摘要 PURPOSE: A CMP(Chemical Mechanical Polishing) apparatus having an adiabatic material is provided to prevent the transmission of heat generated from a driving motor portion by forming the adiabatic material on the driving motor portion. CONSTITUTION: A CMP apparatus(100) includes a flat table(110) and a carrier(120). A polishing pad(113) is adhered on an upper surface of the flat table(110). A vacuum absorbing hole(123) is formed on the carrier(120). A slurry supply portion(160) supplies an abrasive. A driving motor portion(130) is connected with the carrier(120) in order to rotate the carrier(120). A piston portion(150) is installed at an upper portion of the driving motor portion(130) in order to load or unload a wafer(1) on the polishing pad(113). A pump portion(140) has a pump(141), a pass-way block(146), a regulator(143), a solenoid valve(145), a transducer(144), and a UPA board(146). The pump portion(140) is located on an adiabatic material(180).
申请公布号 KR20030003568(A) 申请公布日期 2003.01.10
申请号 KR20010039481 申请日期 2001.07.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SEONG HWAN
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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