发明名称 |
THIN FILM TRANSISTOR AND DISPLAY USING THE SAME |
摘要 |
<p>PROBLEM TO BE SOLVED: To solve the problem that a threshold voltage varies with increase in fixed charges due to the rise in the hydrogen concentration in a gate insulation film at hydrogen terminals of defects in a channel region or source-drain region in a hydrogenising process. SOLUTION: The hydrogen concentration in an undercoat contacted to a source-drain region is set to be higher than that in an undercoat contacted to a channel region, to thereby improve the hydrogen terminating effect of the source-drain region and suppress the hydrogen supply to a gate insulation film to a minimum.</p> |
申请公布号 |
JP2003007718(A) |
申请公布日期 |
2003.01.10 |
申请号 |
JP20010187704 |
申请日期 |
2001.06.21 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
NISHIO MIKIO |
分类号 |
G02F1/1368;G09F9/30;G09F9/35;H01L21/322;H01L21/336;H01L27/32;H01L29/786;(IPC1-7):H01L21/336;G02F1/136 |
主分类号 |
G02F1/1368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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