发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR FILM
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing semiconductor film by which the occurrence of cracks and warps can be suppressed, while a nitride semiconductor film is secured widely in the same degree as that of a substrate. SOLUTION: A GaN film 12 which is a first semiconductor film is epitaxially grown on a sapphire substrate 11, and a pyrolytically decomposed layer 14 is interposed between the substrate 11 and film 12 by irradiating the film 12 with a laser light from the rear surface side of the substrate 11. After a GaN film 15, which is a second semiconductor film is epitaxially grown while the GaN film 12, is kept on the sapphire substrate 11, the temperature of the substrate 11 is lowered to room temperature. When the substrate 11 is separated from the GaN films 12 and 15 thereafter, a GaN substrate 16 having almost the equal area as the sapphire substrate 11 has is obtained.
申请公布号 JP2003007616(A) 申请公布日期 2003.01.10
申请号 JP20020063281 申请日期 2002.03.08
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OGAWA MASAHIRO;UEDA DAISUKE;ISHIDA MASAHIRO
分类号 C30B29/38;H01L21/20;H01L21/205;H01L33/32;H01S5/323 主分类号 C30B29/38
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