发明名称 MANUFACTURING METHOD OF FLASH MEMORY AND TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a flash memory and a transistor in which the concentration gradient of dopant at a joint part is gentle in a source region while steep in a drain region. SOLUTION: There are provided a step in which a gate 14 is formed on a substrate, a step in which a first dopant is injected into a source formation region, a step in which a dielectric spacer 40 is formed on a side wall part of the gate 14, a step in which a second dopant whose dispersion characteristics is lower than the first dopant is injected into a drain formation region, and a step in which a source region 20-2 and a drain region 22-2 are formed in a thermal dispersion process.
申请公布号 JP2003007878(A) 申请公布日期 2003.01.10
申请号 JP20020137275 申请日期 2002.05.13
申请人 HYNIX SEMICONDUCTOR AMERICA INC 发明人 RABKIN PETER;WANG HSINGYA ARTHUR;QIAN FRANK
分类号 H01L21/8247;H01L21/28;H01L21/336;H01L27/115;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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