发明名称 |
MANUFACTURING METHOD OF FLASH MEMORY AND TRANSISTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a flash memory and a transistor in which the concentration gradient of dopant at a joint part is gentle in a source region while steep in a drain region. SOLUTION: There are provided a step in which a gate 14 is formed on a substrate, a step in which a first dopant is injected into a source formation region, a step in which a dielectric spacer 40 is formed on a side wall part of the gate 14, a step in which a second dopant whose dispersion characteristics is lower than the first dopant is injected into a drain formation region, and a step in which a source region 20-2 and a drain region 22-2 are formed in a thermal dispersion process.
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申请公布号 |
JP2003007878(A) |
申请公布日期 |
2003.01.10 |
申请号 |
JP20020137275 |
申请日期 |
2002.05.13 |
申请人 |
HYNIX SEMICONDUCTOR AMERICA INC |
发明人 |
RABKIN PETER;WANG HSINGYA ARTHUR;QIAN FRANK |
分类号 |
H01L21/8247;H01L21/28;H01L21/336;H01L27/115;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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