| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device which can perform program operation in a short time and with high reliability. SOLUTION: This device is provided with a LT fuse read-out circuit 210 for programming a defective address on a wafer process, an electric fuse circuit 220 for programming electrically a defective address, an electric fuse circuit 230 for storing whether the electric fuse circuit 220 is used or not, a selection circuit 240 for receiving program data by the LT fuse and program data by electric fuse, switching, and outputting it, an electric fuse circuit 250 for specifying switching of the selection circuit 240, and a relief determination circuit 260 comparing an output of the selection circuit 240 with an input address ADD<n:0> from an address buffer 20.
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