发明名称 |
Method and apparatus for testing memory arrays |
摘要 |
A method and apparatus for testing memory arrays where the addresses associated with such arrays exceeds the physical boundaries of the array. Addresses that are outside the physical boundary of the array are considered invalid addresses; while those residing within the physical boundaries are considered valid addresses. The method and apparatus tests the memory array by only loading data into the data out latch of the memory array when a valid address is received.
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申请公布号 |
US2003007393(A1) |
申请公布日期 |
2003.01.09 |
申请号 |
US20010885570 |
申请日期 |
2001.06.20 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
EUSTIS STEVEN MICHAEL;BARRY ROBERT LLOYD;CROCE PETER FRANCIS |
分类号 |
G11C29/18;(IPC1-7):G11C7/00 |
主分类号 |
G11C29/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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