发明名称 METHOD FOR FABRICATING METAL INTERCONNECTION
摘要 PURPOSE: A method for fabricating a metal interconnection is provided to prevent a contact area between a tungsten plug and a metal interconnection from increasing so that via resistance is reduced, by forming a tungsten spacer on the sidewall of the metal interconnection. CONSTITUTION: The metal interconnection(33) is formed on a substrate insulated by an insulation layer, in which the substrate is electrically connected to the metal interconnection. A conductive layer spacer is formed on the insulated substrate(31) at both sides of the metal interconnection. A flat interlayer dielectric(35) is formed on the entire surface including the conductive layer spacer. The interlayer dielectric is selectively etched to form a via hole by using a via contact mask. A plug filling the via hole is formed.
申请公布号 KR20030002523(A) 申请公布日期 2003.01.09
申请号 KR20010038172 申请日期 2001.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, JONG YEOL
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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