发明名称 ANGLED IMPLANT PROCESS
摘要 Different symmetrical and asymmetrical devices are formed on the same chip using non-critical block masks and angled implants. A barrier is selectively formed adjacent one side of a structure and this barrier blocks dopant implanted at an angle toward the structure. Other structures have no barrier or have two barriers. Source and drain engineering can be performed for LDD, halo, and other desired implants.
申请公布号 US2003008484(A1) 申请公布日期 2003.01.09
申请号 US20010898949 申请日期 2001.07.03
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HOOK TERENCE B.
分类号 H01L21/265;H01L21/336;H01L21/8234;H01L29/78;(IPC1-7):H01L21/425 主分类号 H01L21/265
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